Inverse determination of thermal conductivity using semi-discretization method
نویسندگان
چکیده
منابع مشابه
Determination of porous Silicon thermal conductivity using the “Mirage effect” method
Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different kind of samples , transverse photothermal deflection PTD in skimming configuration with ccd camera and special programs is used to determine thermal conductivity of porous silicon ps film. Ps samples were prepared by electrochemical etching. Thermal conductivity wit...
متن کاملDetermination of porous Silicon thermal conductivity using the “Mirage effect” method
Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different kind of samples , transverse photothermal deflection PTD in skimming configuration with ccd camera and special programs is used to determine thermal conductivity of porous silicon ps film. Ps samples were prepared by electrochemical etching. Thermal conductivity wit...
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متن کاملdetermination of porous silicon thermal conductivity using the “mirage effect” method
mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different kind of samples , transverse photothermal deflection ptd in skimming configuration with ccd camera and special programs is used to determine thermal conductivity of porous silicon ps film. ps samples were prepared by electrochemical etching. thermal conductivity wit...
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ژورنال
عنوان ژورنال: Applied Mathematical Modelling
سال: 2009
ISSN: 0307-904X
DOI: 10.1016/j.apm.2008.03.001